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The breakthrough combines excellent electromagnetic shielding with ease of manufacture and electrical isolation
Researchers are creating an autonomous mobile robot to sample leaves and measure their water potential
New Department of Defense Center of Excellence will help develop secure, fully networked command, control, and communications infrastructures
Simple process transforms PET plastic into a nanomaterial for energy storage
Amit Roy-Chowdhury leads project that will develop robust context-aware machine vision for computers
Project will develop energy-efficient, energy-elastic, and real-time-aware graphic-processing units
The disposable, low-cost tool will improve the speed and accuracy of investigations
A new robot developed at UC Riverside can navigate uneven surfaces with silicone legs
Just 25 industry-standard fast charging cycles can ruin a car’s batteries
Researchers are building a tool that searches real-time text, photo, and video from many sources to help responders allocate resources
Pointing the new nanoscopy tool like a Harry Potter wand reveals a high-resolution image of molecules
UCR engineering professors receive $1.2M Navy grant to make artificial intelligent (AI) systems smarter
Magnonic devices of the future could use low power to avoid performance losses
Confusing channel state information offers a first line of defense in full-duplex wireless
Two electrical and computer engineering (ECE) faculty at the University of California, Riverside have been named to the 2018 Highly Cited Researchers list compiled by Clarivate Analytics, which was previously part of the Thomson Reuters. The list includes frequently cited researchers in 21 fields of the sciences and social sciences...
Five GAANN Awards from the U.S. Department of Education will support 90 engineering graduate students
The discovery could make production of some electronic components cheaper, easier, and faster
Small Business Innovation Research Program provides seed funding for BEAM-CA, LLC
Graphene thermal interface and steam hydrogasification receive TechConnect National Innovation Awards
Electromigration at normal operating temperatures causes integrated circuits to fail in hours instead of years, allowing researchers to assess how durable they are
